Properties of low-refractive-index films obtained by the close-spaced vapor transport technique under the sublimation of graphite in a quasi-closed volume

Сопинский, Н.В. and Хомченко, В.С. and Литвин, Оксана Степанівна and Савин, А.К. and Семененко, Н.А. and Евтух, А.А. and Соболевский, В.П. and Ольховик, Г.П. (2011) Properties of low-refractive-index films obtained by the close-spaced vapor transport technique under the sublimation of graphite in a quasi-closed volume Журнал технической физики, 81 (11). pp. 125-129. ISSN 0044-4642

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Abstract

The properties of low-refractive-index carbon films obtained by close-spaced vapor transport at graphite sublimation are studied. The optical properties of the films are investigated by monochromatic multiple-angle ellipsometry, and their morphology is examined by AFM. It is found that the films have a columnar structure with a background surface roughness of about 1 nm. In addition, the surface of the film contains islands up to 50 nm in height with a footprint of ≈200 nm. A low-refractive-index carbon film deposited by close-spaced vapor transport on silicon tips is found to decrease the field emission threshold and drastically raise the current.

Item Type: Article
Uncontrolled Keywords: low-refractive-index carbon films; multiple-angle ellipsometry; atomic force microscopy
Subjects: Articles in journals > Наукові (входять до інших наукометричних баз, крім перерахованих, мають ISSN, DOI, індекс цитування)
Divisions: Institutes > Institute of Society > Chair of Information Technologies and Mathematics > Chair of Computer Science
Depositing User: Оксана Степанівна Литвин
Date Deposited: 30 Sep 2013 13:57
Last Modified: 20 Nov 2015 13:47
URI: http://elibrary.kubg.edu.ua/id/eprint/2238

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